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Energy-band alignments at LaAlO[sub 3] and Ge interfaces

13th Nov 2006, 22:42 GMT

Y. Y. Mi, S. J. Wang, J. W. Chai, J. S. Pan, A. C. H. Huan et al. The energy-band alignments for LaAlO[sub 3] films on p-Ge(001) with and without GeO[sub x]N[sub y] interfacial layer have been studied using photoemission spectroscopy. The valence-band offsets at LaAlO[sub 3]/GeO[sub x]N[sub y]/Ge and LaAlO[sub 3]/Ge interfaces were measured to be 2.70 and 3.06 eV ... [Appl. Phys. Lett. 89, 202107 (2006)] published Mon Nov 13, 2006.

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